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The Temperature-Sensitivity of a Critical Electric Field Induced Magnetic Easy-Axis Reorientation Ferromagnetic/Ferroelectric Layered Heterostructures

Thi Minh Hong Nguyen and Duc Thang Pham and Dinh Long Dang and Thai Ha Pham and Ngoc Trung Nguyen and Hong Cong Pham and Dinh Duc Nguyen (2014) The Temperature-Sensitivity of a Critical Electric Field Induced Magnetic Easy-Axis Reorientation Ferromagnetic/Ferroelectric Layered Heterostructures. Communications in Physics, 24 (3S1). p. 71. ISSN 0868-3166

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Official URL: DOI: 10.15625/0868-3166/24/3S1/5222

Abstract

We have investigated the effects of temperature on the magnetic easy axis reorientation (EARs) in polycrystalline ferromagnetic (FM) nano-scale thin films, i.e. (001)-oriented cubic films such as Fe, Ni, CFO and (0001)-oriented hexagonal films such as Co, grown on ferroelectric (FE) substrates, for example PZT, BTO substrates. The model of FM/FE bilayered heterostructures has been applied to study the total free energy of the FM films. By minimizing this energy, we have shown that temperature has a significant effect on a critical electric field induced magnetic reorientation.

Item Type:Article
Subjects:Engineering Mechanics
Engineering Physics
Divisions:Faculty of Engineering Physics and Nanotechnology (FEPN)
ID Code:1268
Deposited By: Ms. Cam Le Tran Thi
Deposited On:08 Nov 2015 08:51
Last Modified:09 Nov 2015 05:56

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