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A Comprehensive Reliability Assessment of Fault-Resilient Network-on-Chip Using Analytical Model

Nam Khanh Dang and Akram Ben Ahmed and Xuan Tu Tran and Yuichi Okuyama and Abderazek Ben Abdallah (2017) A Comprehensive Reliability Assessment of Fault-Resilient Network-on-Chip Using Analytical Model. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 25 (11). pp. 3099-3112. ISSN 1063-8210

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Official URL: http://ieeexplore.ieee.org/document/8012492/


Item Type:Article
Subjects:Electronics and Communications
Electronics and Communications > Electronics and Computer Engineering
Scopus-indexed journals
ISI-indexed journals
Divisions:Faculty of Electronics and Telecommunications (FET)
Key Laboratory for Smart Integrated Systems (SISLAB)
ID Code:2562
Deposited By: Prof. Xuan-Tu Tran
Deposited On:31 Jul 2017 03:09
Last Modified:07 Dec 2017 06:49

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