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Items where Author is "Akram Ben Ahmed"

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Article

Nam Khanh Dang and Akram Ben Ahmed and Yuichi Okuyama and Abderazek Ben Abdallah (2017) Scalable design methodology and online algorithm for TSV-cluster defects recovery in highly reliable 3D-NoC systems. IEEE Transactions on Emerging Topics in Computing . ISSN 2168-6750 (In Press)

Nam Khanh Dang and Akram Ben Ahmed and Xuan Tu Tran and Yuichi Okuyama and Abderazek Ben Abdallah (2017) A Comprehensive Reliability Assessment of Fault-Resilient Network-on-Chip Using Analytical Model. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 25 (11). pp. 3099-3112. ISSN 1063-8210

This list was generated on Wed Jun 20 05:50:31 2018 ICT.