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Items where Author is "Akram Ben Ahmed"

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Nam Khanh Dang and Akram Ben Ahmed and Xuan Tu Tran and Yuichi Okuyama and Abderazek Ben Abdallah (2017) A Comprehensive Reliability Assessment of Fault-Resilient Network-on-Chip Using Analytical Model. IEEE Transactions on Very Large Scale Integration (VLSI) Systems . ISSN 1063-8210 (In Press)

This list was generated on Wed Nov 22 10:28:29 2017 ICT.