?url_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.au=Nguyen%2C+Ha+Anh+Tuan&rft.aulast=Nguyen&rft.aufirst=Ha+Anh+Tuan&rft.date=17+August+2012&rft.title=A+Maximum+Likelihood+Method+for+Detecting+Bad+Samples+from+Illumina+BeadChips+Data&rft.genre=proceeding