eprintid: 1266
rev_number: 9
eprint_status: archive
userid: 5
dir: disk0/00/00/12/66
datestamp: 2015-11-08 08:54:43
lastmod: 2015-11-08 08:55:51
status_changed: 2015-11-08 08:54:43
type: article
metadata_visibility: show
creators_name: Nguyen, Thi Minh Hong
creators_name: Pham, Thai Ha
creators_name: Le, Viet Cuong
creators_name: Pham, T. Long
creators_name: Pham, Duc Thang
creators_id: hongntm@vnu.edu.vn
creators_id: cuonglv@vnu.edu.vn
creators_id: pdthang@vnu.edu.vn
title: Electrical Field Induced Magnetization Switching in CoFe/NiFe/PZT Multiferroics
ispublished: pub
subjects: Phys
subjects: isi
divisions: fac_physic
abstract: In this paper, we have investigated the change in magnetization of multiferroic material, based on magnetic nanostructured CoFe/NiFe film grown on the piezoelectric lead zirconate titanate (PZT), under the effect of the strain originated from PZT layer. In this material, a converse magnetoelectric effect and especially, an electric field-induced magnetic anisotropy and magnetization switching process have been observed at the changing stages of applied electric voltage. In addition, a significant relative change in magnetization, above 100%, is obtained, which facilitates practical applications of the materials. This opens possibilities in achieving new types of memory devices, the low energy consumption devices, as well as other functionalities, such as voltage-tunable field sensing. A simple theory based on strain-mediated magnetic-electric coupling is also presented to understand the origin of the change in magnetic properties of the materials.
date: 2014
date_type: published
publisher: IEEE
official_url: DOI: 10.1109/TMAG.2014.2304518
full_text_status: none
publication: IEEE Transactions on Magnetics
volume: 50
number: 6
pagerange: 2005204
refereed: TRUE
issn: 0018-9464
citation:   Nguyen, Thi Minh Hong and Pham, Thai Ha and Le, Viet Cuong and Pham, T. Long and Pham, Duc Thang  (2014) Electrical Field Induced Magnetization Switching in CoFe/NiFe/PZT Multiferroics.  IEEE Transactions on Magnetics, 50  (6).   p. 2005204.  ISSN 0018-9464