@article{SisLab1268,
          volume = {24},
          number = {3S1},
           title = {The Temperature-Sensitivity of a Critical Electric Field Induced Magnetic Easy-Axis Reorientation Ferromagnetic/Ferroelectric Layered Heterostructures},
          author = {Thi Minh Hong Nguyen and Duc Thang Pham and Dinh Long Dang and Thai Ha Pham and Ngoc Trung Nguyen and Hong Cong Pham and Dinh Duc Nguyen},
            year = {2014},
           pages = {71},
         journal = {Communications in Physics},
             url = {https://eprints.uet.vnu.edu.vn/eprints/id/eprint/1268/},
        abstract = {We have investigated the effects of temperature on the magnetic easy axis reorientation (EARs) in polycrystalline ferromagnetic (FM) nano-scale thin films, i.e. (001)-oriented cubic films such as Fe, Ni, CFO and (0001)-oriented hexagonal films such as Co, grown on ferroelectric (FE) substrates, for example PZT, BTO substrates. The model of FM/FE bilayered heterostructures has been applied to study the total free energy of the FM films. By minimizing this energy, we have shown that temperature has a significant effect on a critical electric field induced magnetic reorientation.}
}