relation: https://eprints.uet.vnu.edu.vn/eprints/id/eprint/1268/
title: The Temperature-Sensitivity of a Critical Electric Field Induced Magnetic Easy-Axis Reorientation Ferromagnetic/Ferroelectric Layered Heterostructures
creator: Nguyen, Thi Minh Hong
creator: Pham, Duc Thang
creator: Dang, Dinh Long
creator: Pham, Thai Ha
creator: Nguyen, Ngoc Trung
creator: Pham, Hong Cong
creator: Nguyen, Dinh Duc
subject: Engineering Mechanics
subject: Engineering Physics
description: We have investigated the effects of temperature on the magnetic easy axis reorientation (EARs) in polycrystalline ferromagnetic (FM) nano-scale thin films, i.e. (001)-oriented cubic films such as Fe, Ni, CFO and (0001)-oriented hexagonal films such as Co, grown on ferroelectric (FE) substrates, for example PZT, BTO substrates. The model of FM/FE bilayered heterostructures has been applied to study the total free energy of the FM films. By minimizing this energy, we have shown that temperature has a significant effect on a critical electric field induced magnetic reorientation.
date: 2014
type: Article
type: PeerReviewed
identifier:   Nguyen, Thi Minh Hong and Pham, Duc Thang and Dang, Dinh Long and Pham, Thai Ha and Nguyen, Ngoc Trung and Pham, Hong Cong and Nguyen, Dinh Duc  (2014) The Temperature-Sensitivity of a Critical Electric Field Induced Magnetic Easy-Axis Reorientation Ferromagnetic/Ferroelectric Layered Heterostructures.  Communications in Physics, 24  (3S1).   p. 71.  ISSN 0868-3166     
relation: DOI: 10.15625/0868-3166/24/3S1/5222