%0 Journal Article
%@ 0868-3166
%A Nguyen, Thi Minh Hong
%A Pham, Duc Thang
%A Dang, Dinh Long
%A Pham, Thai Ha
%A Nguyen, Ngoc Trung
%A Pham, Hong Cong
%A Nguyen, Dinh Duc
%D 2014
%F SisLab:1268
%J Communications in Physics
%N 3S1
%P 71
%T The Temperature-Sensitivity of a Critical Electric Field Induced Magnetic Easy-Axis Reorientation Ferromagnetic/Ferroelectric Layered Heterostructures
%U https://eprints.uet.vnu.edu.vn/eprints/id/eprint/1268/
%V 24
%X We have investigated the effects of temperature on the magnetic easy axis reorientation (EARs) in polycrystalline ferromagnetic (FM) nano-scale thin films, i.e. (001)-oriented cubic films such as Fe, Ni, CFO and (0001)-oriented hexagonal films such as Co, grown on ferroelectric (FE) substrates, for example PZT, BTO substrates. The model of FM/FE bilayered heterostructures has been applied to study the total free energy of the FM films. By minimizing this energy, we have shown that temperature has a significant effect on a critical electric field induced magnetic reorientation.