TY  - JOUR
ID  - SisLab1268
UR  - DOI: 10.15625/0868-3166/24/3S1/5222
IS  - 3S1
A1  - Nguyen, Thi Minh Hong
A1  - Pham, Duc Thang
A1  - Dang, Dinh Long
A1  - Pham, Thai Ha
A1  - Nguyen, Ngoc Trung
A1  - Pham, Hong Cong
A1  - Nguyen, Dinh Duc
Y1  - 2014///
N2  - We have investigated the effects of temperature on the magnetic easy axis reorientation (EARs) in polycrystalline ferromagnetic (FM) nano-scale thin films, i.e. (001)-oriented cubic films such as Fe, Ni, CFO and (0001)-oriented hexagonal films such as Co, grown on ferroelectric (FE) substrates, for example PZT, BTO substrates. The model of FM/FE bilayered heterostructures has been applied to study the total free energy of the FM films. By minimizing this energy, we have shown that temperature has a significant effect on a critical electric field induced magnetic reorientation.
JF  - Communications in Physics
VL  - 24
SN  - 0868-3166
TI  - The Temperature-Sensitivity of a Critical Electric Field Induced Magnetic Easy-Axis Reorientation Ferromagnetic/Ferroelectric Layered Heterostructures
AV  - none
ER  -