eprintid: 1268
rev_number: 11
eprint_status: archive
userid: 5
dir: disk0/00/00/12/68
datestamp: 2015-11-08 08:51:53
lastmod: 2015-11-09 05:56:20
status_changed: 2015-11-08 08:51:53
type: article
metadata_visibility: show
creators_name: Nguyen, Thi Minh Hong
creators_name: Pham, Duc Thang
creators_name: Dang, Dinh Long
creators_name: Pham, Thai Ha
creators_name: Nguyen, Ngoc Trung
creators_name: Pham, Hong Cong
creators_name: Nguyen, Dinh Duc
creators_id: hongntm@vnu.edu.vn
creators_id: pdthang@vnu.edu.vn
creators_id: ddlong@vnu.edu.vn
creators_id: ducnd@vnu.edu.vn
title: The Temperature-Sensitivity of a Critical Electric Field Induced Magnetic Easy-Axis Reorientation Ferromagnetic/Ferroelectric Layered Heterostructures
ispublished: pub
subjects: Mechanics
subjects: Phys
divisions: fac_physic
abstract: We have investigated the effects of temperature on the magnetic easy axis reorientation (EARs) in polycrystalline ferromagnetic (FM) nano-scale thin films, i.e. (001)-oriented cubic films such as Fe, Ni, CFO and (0001)-oriented hexagonal films such as Co, grown on ferroelectric (FE) substrates, for example PZT, BTO substrates. The model of FM/FE bilayered heterostructures has been applied to study the total free energy of the FM films. By minimizing this energy, we have shown that temperature has a significant effect on a critical electric field induced magnetic reorientation.
date: 2014
date_type: published
official_url: DOI: 10.15625/0868-3166/24/3S1/5222
full_text_status: none
publication: Communications in Physics
volume: 24
number: 3S1
pagerange: 71
refereed: TRUE
issn: 0868-3166
citation:   Nguyen, Thi Minh Hong and Pham, Duc Thang and Dang, Dinh Long and Pham, Thai Ha and Nguyen, Ngoc Trung and Pham, Hong Cong and Nguyen, Dinh Duc  (2014) The Temperature-Sensitivity of a Critical Electric Field Induced Magnetic Easy-Axis Reorientation Ferromagnetic/Ferroelectric Layered Heterostructures.  Communications in Physics, 24  (3S1).   p. 71.  ISSN 0868-3166