TY  - CONF
ID  - SisLab1379
UR  - Doi: 10.1109/ATC.2014.7043422
A1  - Pham, Toan Thang
A1  - Bach, Gia-Duong
A1  - Vu, Van Yem
A1  - Ledoux-Rak, I
A1  - Journet, Bernard
Y1  - 2014/10/01/
N2  - The classical structure of an optoelectronic oscillator (OEO) is based on a long optical fiber loop creating a delay line with very low insertion loss. The oscillation frequency is proportional to the reciprocal of the propagation delay which depends on temperature by the way of the effective refractive index of the fiber. In case of a long fiber loop, even a small change of the temperature can induce an oscillation frequency drift. In this paper, a system based on a vector network analyzer (VNA) is proposed to monitor the oscillation frequency drift with a minimum of extra optical components. There is a good correlation between the phase evolution determined by the VNA and the OEO frequency drift. Knowing the drift it is possible to correct results obtained from the OEO used as an optical path measurement tool for either distance or refractive index variation detection.
TI  - Monitoring the Oscillation Frequency Drift of an Optoelectronic Oscillator with a Vector Network Analyzer
SP  - 411
M2  - Hanoi, Vietnam
AV  - none
EP  - 416
T2  - 2014: The 7th International Conference on Advanced Technologies for Communications (ATC 2014)
ER  -