eprintid: 1540
rev_number: 8
eprint_status: archive
userid: 244
dir: disk0/00/00/15/40
datestamp: 2016-05-22 08:15:43
lastmod: 2016-05-22 08:19:16
status_changed: 2016-05-22 08:15:43
type: conference_item
metadata_visibility: show
creators_name: Vu, Thi Dao
creators_name: Pham, Ngoc Hung
creators_name: Nguyen, Viet Ha
creators_id: hungpn@vnu.edu.vn
creators_id: hanv@vnu.edu.vn
title: A Method for Automated Test Data Generation from Sequence Diagrams and Object Constraint Language
ispublished: pub
subjects: IT
divisions: fac_fit
abstract: This paper proposes an automated test data generation method from the information embedded in model elements such as Unified Modeling Language (UML) sequence diagrams, class diagrams, and Object Constraint Language (OCL). The method supports UML 2.0 sequence diagrams including eight kinds of combined fragments describing control flow of systems. Comparing with some approaches by using depth first search (DFS) or breadth first search (BFS) algorithms, the proposed method generates all possible test scenarios with the higher error uncover capability. Test data for testing loop fragment is also generated. Therefore, it helps to detect errors in testing loops and the concurrency errors such as safety and liveness property of the systems.
date: 2015
date_type: published
official_url: http://dl.acm.org/citation.cfm?doid=2833258.2833294
full_text_status: none
pres_type: paper
publication: SoICT 2015
pagerange: 335-341
event_title: SoICT: the 2015 Symposium on Information and Communication Technology
event_location: Hue, Vietnam
event_dates: 3-4 December 2015
event_type: conference
refereed: TRUE
citation:   Vu, Thi Dao and Pham, Ngoc Hung and Nguyen, Viet Ha  (2015) A Method for Automated Test Data Generation from Sequence Diagrams and Object Constraint Language.  In: SoICT: the 2015 Symposium on Information and Communication Technology, 3-4 December 2015, Hue, Vietnam.