<> "The repository administrator has not yet configured an RDF license."^^ . <> . . . "Design-for-Test Approach of an Asynchronous Network-on-Chip Architecture and its Associated Test Pattern Generation and\r\nApplication"^^ . "Asynchronous design offers an attractive solution to address the problems faced by networks-on-chip (NoC) designers such as timing constraints. Nevertheless, post-fabrication testing is a big challenge to bring the\r\nasynchronous NoCs to the market because of a lack of testing methodology and support. This study first presents\r\nthe design and implementation of a design-for-test (DfT) architecture, which improves the testability of an asynchronous NoC architecture. Then, a simple method for generating test patterns for network routers is described. Test patterns are automatically generated by a custom program, given the network topology and the network size. Finally, we introduce a testing strategy for the whole asynchronous NoC. With the generated test patterns, the testing methodology presents high fault coverage (99.86%) for single stuck-at fault models."^^ . "2009-09" . . "3" . "5" . . "IET"^^ . . . "IET Computers & Digital Techniques"^^ . . . "17518601" . . . . . . . . . . . . . . . . . . . "Chantal"^^ . "Robach"^^ . "Chantal Robach"^^ . . "Vincent"^^ . "Beroulle"^^ . "Vincent Beroulle"^^ . . "Xuan Tu"^^ . "Tran"^^ . "Xuan Tu Tran"^^ . . "Yvain"^^ . "Thonnart"^^ . "Yvain Thonnart"^^ . . "Jean"^^ . "Durupt"^^ . "Jean Durupt"^^ . . . . . . "Design-for-Test Approach of an Asynchronous Network-on-Chip Architecture and its Associated Test Pattern Generation and\r\nApplication (PDF)"^^ . . . . . . . . "Design-for-test_approach_of_an_asynchronous_network-on-chip_architecture-published-IET.pdf"^^ . . . "Design-for-Test Approach of an Asynchronous Network-on-Chip Architecture and its Associated Test Pattern Generation and\r\nApplication (Image (PNG))"^^ . . . . . . "preview.png"^^ . . "HTML Summary of #22 \n\nDesign-for-Test Approach of an Asynchronous Network-on-Chip Architecture and its Associated Test Pattern Generation and \nApplication\n\n" . "text/html" . . . "Electronics and Communications"@en . . . "Electronics and Computer Engineering"@en . . . "ISI-indexed journals"@en . .