relation: https://eprints.uet.vnu.edu.vn/eprints/id/eprint/2364/
title: Image blur analysis for the subpixel-level measurement of in-plane vibration parameters of MEMS resonators
creator: Le, Vu Ha
creator: Gouiffes, Michele
creator: Parrain, Fabien
creator: Bosseboeuf, Alain
creator: Zavidovique, Bertrand
subject: Communications
subject: Electronics and Communications
subject: Electronics and Computer Engineering
subject: Information Technology (IT)
date: 2007-08
type: Conference or Workshop Item
type: PeerReviewed
identifier:   Le, Vu Ha and Gouiffes, Michele and Parrain, Fabien and Bosseboeuf, Alain and Zavidovique, Bertrand  (2007) Image blur analysis for the subpixel-level measurement of in-plane vibration parameters of MEMS resonators.  In: SPIE Optical Engineering + Applications, 2007, San Diego, CA, USA.     
relation: http://doi.org/10.1117/12.733533
relation: doi:10.1117/12.733533