eprintid: 2364
rev_number: 15
eprint_status: archive
userid: 281
dir: disk0/00/00/23/64
datestamp: 2017-11-23 07:08:20
lastmod: 2017-11-23 07:08:20
status_changed: 2017-11-23 07:08:20
type: conference_item
succeeds: 1850
metadata_visibility: show
creators_name: Le, Vu Ha
creators_name: Gouiffes, Michele
creators_name: Parrain, Fabien
creators_name: Bosseboeuf, Alain
creators_name: Zavidovique, Bertrand
creators_id: halv@vnu.edu.vn
creators_id: michele.gouiffes@limsi.fr
creators_id: fabien.parrain@c2n.upsaclay.fr
creators_id: alain.bosseboeuf@c2n.upsaclay.fr
creators_id: zavido@ief.u-psud.fr
title: Image blur analysis for the subpixel-level measurement of in-plane vibration parameters of MEMS resonators
ispublished: pub
subjects: Communications
subjects: ECE
subjects: ElectronicsandComputerEngineering
subjects: IT
divisions: fac_fet
date: 2007-08
date_type: published
official_url: http://doi.org/10.1117/12.733533
id_number: doi:10.1117/12.733533
full_text_status: none
pres_type: paper
volume: 6696
pagerange: 66962D-66962D
event_title: SPIE Optical Engineering + Applications
event_location: San Diego, CA, USA
event_dates: 2007
event_type: conference
refereed: TRUE
issn: 0277786X
book_title: Applications of Digital Image Processing XXX
citation:   Le, Vu Ha and Gouiffes, Michele and Parrain, Fabien and Bosseboeuf, Alain and Zavidovique, Bertrand  (2007) Image blur analysis for the subpixel-level measurement of in-plane vibration parameters of MEMS resonators.  In: SPIE Optical Engineering + Applications, 2007, San Diego, CA, USA.