relation: https://eprints.uet.vnu.edu.vn/eprints/id/eprint/2562/
title: A Comprehensive Reliability Assessment of Fault-Resilient Network-on-Chip Using Analytical Model
creator: Dang, Nam Khanh
creator: Ahmed, Akram Ben
creator: Tran, Xuan Tu
creator: Okuyama, Yuichi
creator: Abdallah, Abderazek Ben
subject: Electronics and Communications
subject: Electronics and Computer Engineering
subject: Scopus-indexed journals
subject: ISI-indexed journals
publisher: IEEE
date: 2017-08
type: Article
type: PeerReviewed
identifier:   Dang, Nam Khanh and Ahmed, Akram Ben and Tran, Xuan Tu and Okuyama, Yuichi and Abdallah, Abderazek Ben  (2017) A Comprehensive Reliability Assessment of Fault-Resilient Network-on-Chip Using Analytical Model.  IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 25  (11).   pp. 3099-3112.  ISSN 1063-8210     
relation: http://ieeexplore.ieee.org/document/8012492/
relation: 10.1109/TVLSI.2017.2736004