%0 Journal Article
%@ 1063-8210
%A Dang, Nam Khanh
%A Ahmed, Akram Ben
%A Tran, Xuan Tu
%A Okuyama, Yuichi
%A Abdallah, Abderazek Ben
%D 2017
%F SisLab:2562
%I IEEE
%J IEEE Transactions on Very Large Scale Integration (VLSI) Systems
%N 11
%P 3099-3112
%T A Comprehensive Reliability Assessment of Fault-Resilient Network-on-Chip Using Analytical Model
%U https://eprints.uet.vnu.edu.vn/eprints/id/eprint/2562/
%V 25