TY  - JOUR
ID  - SisLab2562
UR  - http://ieeexplore.ieee.org/document/8012492/
IS  - 11
A1  - Dang, Nam Khanh
A1  - Ahmed, Akram Ben
A1  - Tran, Xuan Tu
A1  - Okuyama, Yuichi
A1  - Abdallah, Abderazek Ben
Y1  - 2017/08//
PB  - IEEE
JF  - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
VL  - 25
SN  - 1063-8210
TI  - A Comprehensive Reliability Assessment of Fault-Resilient Network-on-Chip Using Analytical Model
SP  - 3099
AV  - none
EP  - 3112
ER  -