%A Nam Khanh Dang
%A Akram Ben Ahmed
%A Xuan Tu Tran
%A Yuichi Okuyama
%A Abderazek Ben Abdallah
%J IEEE Transactions on Very Large Scale Integration (VLSI) Systems
%T A Comprehensive Reliability Assessment of Fault-Resilient Network-on-Chip Using Analytical Model
%N 11
%P 3099-3112
%V 25
%D 2017
%I IEEE
%R 10.1109/TVLSI.2017.2736004
%L SisLab2562