eprintid: 2562
rev_number: 10
eprint_status: archive
userid: 4
dir: disk0/00/00/25/62
datestamp: 2017-07-31 03:09:51
lastmod: 2017-12-07 06:49:09
status_changed: 2017-07-31 03:09:51
type: article
metadata_visibility: show
creators_name: Dang, Nam Khanh
creators_name: Ahmed, Akram Ben
creators_name: Tran, Xuan Tu
creators_name: Okuyama, Yuichi
creators_name: Abdallah, Abderazek Ben
creators_id: dnk0904@gmail.com
creators_id: tutx@vnu.edu.vn
creators_id: benab@u-aizu.ac.jp
title: A Comprehensive Reliability Assessment of Fault-Resilient Network-on-Chip Using Analytical Model
ispublished: pub
subjects: ECE
subjects: ElectronicsandComputerEngineering
subjects: Scopus
subjects: isi
divisions: fac_fet
divisions: lab_sis
date: 2017-08
date_type: published
publisher: IEEE
official_url: http://ieeexplore.ieee.org/document/8012492/
id_number: 10.1109/TVLSI.2017.2736004
full_text_status: none
publication: IEEE Transactions on Very Large Scale Integration (VLSI) Systems
volume: 25
number: 11
pagerange: 3099-3112
refereed: TRUE
issn: 1063-8210
citation:   Dang, Nam Khanh and Ahmed, Akram Ben and Tran, Xuan Tu and Okuyama, Yuichi and Abdallah, Abderazek Ben  (2017) A Comprehensive Reliability Assessment of Fault-Resilient Network-on-Chip Using Analytical Model.  IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 25  (11).   pp. 3099-3112.  ISSN 1063-8210