?url_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.au=Pham%2C+Van+Thanh&rft.aulast=Pham&rft.aufirst=Van+Thanh&rft.issue=2013&rft.volume=40&rft.date=2013&rft.atitle=Interface+Charge+Trap+Density+of+Solution+Processed+Ferroelectric+Gate+Thin+Film+Transistor+Using+ITO%2FPZT%2FPt+Structure&rft.title=Ferroelectrics+Letters&rft.pages=17-29&rft.genre=article