<> "The repository administrator has not yet configured an RDF license."^^ . <> . . . "Interface Charge Trap Density of Solution Processed Ferroelectric Gate Thin Film Transistor Using ITO/PZT/Pt Structure"^^ . "The conductance method was applied to investigate the interface charge trap density\r\n(Dit) of solution processed ferroelectric gate thin film transistor (FGT) using indium-tin\r\noxide (ITO)/ Pb(Zr,Ti)O3 (PZT)/Pt structure. As a result, a large value of Dit of MFS\r\ncapacitor, i.e., Pt/PZT/ITO, was estimated to be 1.2 × 1014 eV−1 cm−2. This large Dit\r\nmeans that an interface between the ITO layer and the PZT layer is imperfect and it is\r\none of themain reasons for the poor memory property of this FGT. By using transmission\r\nelectron microscopy (TEM), this imperfect interface was clearly observed. Thus, it is\r\nconcluded that improvement of this interface is critical for better memory performance."^^ . "2013" . . "40" . "2013" . . "Ferroelectrics Letters"^^ . . . . . . . . . . . . . . . . . . . . . . . "Shimoda"^^ . "Tatsuya"^^ . "Shimoda Tatsuya"^^ . . "Tokumitsu"^^ . "Eisuke"^^ . "Tokumitsu Eisuke"^^ . . "Van Thanh"^^ . "Pham"^^ . "Van Thanh Pham"^^ . . "Trong Tue"^^ . "Phan"^^ . "Trong Tue Phan"^^ . . "Miyasako"^^ . "Takaaki"^^ . "Miyasako Takaaki"^^ . . "Nguyen Quoc Trinh"^^ . "Bui"^^ . "Nguyen Quoc Trinh Bui"^^ . . "PHAM VAN THANH"^^ . . . . . . . "Interface Charge Trap Density of Solution Processed Ferroelectric Gate Thin Film Transistor Using ITO/PZT/Pt Structure (PDF)"^^ . . . "12. Ferroelectrics Letters-2013 (Thanh-Trinh).pdf"^^ . . "HTML Summary of #2621 \n\nInterface Charge Trap Density of Solution Processed Ferroelectric Gate Thin Film Transistor Using ITO/PZT/Pt Structure\n\n" . "text/html" . . . "Engineering Physics" . . . "ISI-indexed journals"@en . .