eprintid: 2711
rev_number: 12
eprint_status: archive
userid: 308
dir: disk0/00/00/27/11
datestamp: 2017-11-29 08:37:24
lastmod: 2017-11-29 08:37:24
status_changed: 2017-11-29 08:37:24
type: conference_item
metadata_visibility: show
creators_name: Vu, Dieu Huong
creators_name: Truong, Anh Hoang
creators_name: Chiba, Yuki
creators_name: Aoki, Toshiaki
creators_id: huongvd@vnu.edu.vn
creators_id: hoangta@vnu.edu.vn
title: Automated testing reactive systems from Event-B model
ispublished: pub
subjects: IT
divisions: fac_fit
abstract: We present a model-based testing approach for reactive systems where both test inputs and expected results are generated from `restricted' Event-B specifications. We show that it is possible to automatically build the restricted Event-B specifications from the original ones base on a knowledge base of the system under tests. The restricted models are to reduce the state space of the original Event-B models while preserving the possible testing paths, so that our model-based generated test suite can archive equivalent path coverage as using the original models. We also present a tool and a testing skeleton that are easy to use so that system developers can effectively test an arbitrary number of scenarios with reactive systems.
date: 2017
date_type: published
full_text_status: public
pres_type: paper
event_title: 2017 4th National Foundation for Science and Technology Development Conference on Information and Computer Science
event_location: Ha Noi, Viet Nam
event_dates: 24-25 November2017
event_type: conference
refereed: FALSE
citation:   Vu, Dieu Huong and Truong, Anh Hoang and Chiba, Yuki and Aoki, Toshiaki  (2017) Automated testing reactive systems from Event-B model.  In: 2017 4th National Foundation for Science and Technology Development Conference on Information and Computer Science, 24-25 November2017, Ha Noi, Viet Nam.     
document_url: https://eprints.uet.vnu.edu.vn/eprints/id/eprint/2711/1/mypaper2.pdf