relation: https://eprints.uet.vnu.edu.vn/eprints/id/eprint/2889/
title: Inconsistency measures for probabilistic knowledge bases
creator: Nguyen, Van Tham
creator: Tran, Trong Hieu
subject: Information Technology (IT)
description: One of the major concerns in knowledge integration is inconsistencies in knowledge bases. An inconsistency measure is  a  tool  that  helps  analyzing  inconsistency  knowledge  bases and  resolving  inconsistencies.  In  recent  years,  a  wide  range  of measures with desirable properties have been proposed, however, these  measures  often  correspond  to  logical,  or  probabilistic-logical  framework.  In  this  paper,  we  investigate  several  inconsistency  measures  and  their  properties  for  the  knowledge  bases represented  by  probabilistic framework.
publisher: IEEE
date: 2017
type: Conference or Workshop Item
type: PeerReviewed
format: application/pdf
language: en
identifier: https://eprints.uet.vnu.edu.vn/eprints/id/eprint/2889/2/KSE_2017.pdf
identifier:   Nguyen, Van Tham and Tran, Trong Hieu  (2017) Inconsistency measures for probabilistic knowledge bases.  In: The 2017 International Conference on Knowledge and Systems Engineering (KSE), 19-21 October 2017, Hue, Vietnam.