?url_ver=Z39.88-2004&rft_id=https%3A%2F%2Fdoi.org%2F10.1088%2F2053-1591%2Faaecf9&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.au=Hoang%2C+Ha&rft.aulast=Hoang&rft.aufirst=Ha&rft.volume=6&rft.date=14+November+2018&rft.issn=2053-1591&rft.atitle=Si-doping+effect+on+solution-processed+In-O+thin-film+transistors&rft.title=Materials+Research+Express&rft.pages=026410-1&rft.genre=article