relation: https://eprints.uet.vnu.edu.vn/eprints/id/eprint/3199/
title: Inconsistency measures for probabilistic knowledge bases
creator: Nguyen, Van Tham
creator: Tran, Trong Hieu
subject: Information Technology (IT)
date: 2017
type: Conference or Workshop Item
type: PeerReviewed
identifier:   Nguyen, Van Tham and Tran, Trong Hieu  (2017) Inconsistency measures for probabilistic knowledge bases.  In: 9th International Conference on Knowledge and Systems Engineering, 19-21 October 2017, Hue, Vietnam.     
relation: https://doi.org/10.1109/KSE.2017.8119450