eprintid: 3199
rev_number: 6
eprint_status: archive
userid: 394
dir: disk0/00/00/31/99
datestamp: 2018-12-11 10:26:50
lastmod: 2018-12-11 10:26:50
status_changed: 2018-12-11 10:26:50
type: conference_item
metadata_visibility: show
creators_name: Nguyen, Van Tham
creators_name: Tran, Trong Hieu
creators_id: hieutt@vnu.edu.vn
title: Inconsistency measures for probabilistic knowledge bases
ispublished: pub
subjects: IT
divisions: fac_fit
date: 2017
date_type: published
official_url: https://doi.org/10.1109/KSE.2017.8119450
full_text_status: none
pres_type: paper
pagerange: 148-153
event_title: 9th International Conference on Knowledge and Systems Engineering
event_location: Hue, Vietnam
event_dates: 19-21 October 2017
event_type: conference
refereed: TRUE
citation:   Nguyen, Van Tham and Tran, Trong Hieu  (2017) Inconsistency measures for probabilistic knowledge bases.  In: 9th International Conference on Knowledge and Systems Engineering, 19-21 October 2017, Hue, Vietnam.