relation: https://eprints.uet.vnu.edu.vn/eprints/id/eprint/3346/
title: Design Optimization of an Anisotropic Magnetoresistance Sensor for Detection of Magnetic Nanoparticles
creator: Bui, Dinh Tu
creator: Le, Khac Quynh
creator: Nguyen, Huu Duc
creator: Do, Thi Huong Giang
creator: Phung, Anh Tuan
creator: Tran, Thi Dung
creator: Cao, Viet Anh
subject: Engineering Physics
description: Recent studies have shown that the magnetic field sensitivity of an anisotropic  magnetoresistance (AMR) sensor using a single-layer Ni80Fe20 thin film can be  considerably improved by increasing the shape anisotropy of the film. In this  work, an effective approach for improving the sensitivity and reducing the  magnetic coercive field as well as the thermal noise contribution in an AMR  Wheatstone bridge sensor is proposed by combining multiple resistors in the  series–parallel combination circuits. Four different AMR sensor designs,  consisting of a single resistor, three and five resistors in series and six resistors  in series–parallel connection, were fabricated by using Ta (10 nm)/Ni80Fe20 (5 nm)/Ta (10 nm) films grown on thermally oxidized Si substrates under the presence and the absence of a biasing magnetic field (900 Oe). The results showed that the sensors based on series–parallel combination gain a magnetic sensitivity (SH) 1.72 times higher than that of the sensor based on the series connection. This optimized sensor has improved the capacity of detecting various oncentrations of magnetic nanoparticles with a detection limit of magnetic moments estimated to be about 0.56 microemu
date: 2018
type: Article
type: PeerReviewed
format: application/pdf
language: en
identifier: https://eprints.uet.vnu.edu.vn/eprints/id/eprint/3346/1/10.1007_s11664-018-6822-4.pdf
identifier:   Bui, Dinh Tu and Le, Khac Quynh and Nguyen, Huu Duc and Do, Thi Huong Giang and Phung, Anh Tuan and Tran, Thi Dung and Cao, Viet Anh  (2018) Design Optimization of an Anisotropic Magnetoresistance Sensor for Detection of Magnetic Nanoparticles.  Journal of Electronic Materials .    ISSN 0361-5235