eprintid: 3640
rev_number: 10
eprint_status: archive
userid: 375
dir: disk0/00/00/36/40
datestamp: 2019-12-04 05:45:07
lastmod: 2019-12-04 05:45:07
status_changed: 2019-12-04 05:45:07
type: conference_item
metadata_visibility: show
creators_name: Dang, Nam Khanh
creators_name: Meyer, Michael
creators_name: Ahmed, Akram Ben
creators_name: Abdallah, Abderazek Ben
creators_name: Tran, Xuan Tu
creators_id: khanh.n.dang@vnu.edu.vn
creators_id: tutx@vnu.edu.vn
title: 2D-PPC: A single-correction multiple-detection method for Through-Silicon-Via Faults
ispublished: pub
subjects: ECE
divisions: fac_fet
divisions: lab_sis
abstract: —Through-Silicon-Via (TSV) is one of the most
promising technologies to realize 3D Integrated Circuits (3D-
ICs). However, the reliability issues due to the low yield rates,
the sensitivity to thermal hotspots and stress issues due to the
difference in temperature between layers are preventing TSV-
based 3D-ICs from being widely and efficiently used. Due to
defect clustering, 3D-ICs could have multiple defects in the same
region which cannot be detected by using error correction codes
while dedicated testing could take a significant number of testing
cycles. This paper presents a 2D Parity Product Code (2D-PPC)
with the ability to correct one fault and detect, at least, two
faults. With the extension using Orthogonal Latin Square, 2D-
PPC could detect multiple defects while reasonably increasing
the area cost and latency.
date: 2019-11
date_type: published
contact_email: khanh.n.dang@vnu.edu.vn
full_text_status: restricted
pres_type: paper
event_title: IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)
event_location: Bangkok
event_dates: 11-14 November 2019
event_type: conference
refereed: TRUE
citation:   Dang, Nam Khanh and Meyer, Michael and Ahmed, Akram Ben and Abdallah, Abderazek Ben and Tran, Xuan Tu  (2019) 2D-PPC: A single-correction multiple-detection method for Through-Silicon-Via Faults.  In: IEEE Asia Pacific Conference on Circuits and Systems (APCCAS), 11-14 November 2019, Bangkok.     
document_url: https://eprints.uet.vnu.edu.vn/eprints/id/eprint/3640/1/c5_apccas.pdf