<> "The repository administrator has not yet configured an RDF license."^^ . <> . . . "TSV-OCT: A Scalable Online Multiple-TSV Defects Localization for Real-Time 3-D-IC Systems"^^ . "In order to detect and localize TSV failures in\r\nboth manufacturing and operating phases, most of the existing\r\nmethods use a dedicated testing mechanism with long response\r\ntime and prerequisite interruptions for on-line testing. This paper\r\npresents an ECC-based method named “Through-Silicon-Via On\r\nCommunication Test” (TSV-OCT) to detect and localize faults\r\nwithout halting the operation of TSV-based 3D-IC systems. We\r\nfirst propose Statistical Detector, a method to detect open and\r\nshort defects in TSVs that work in parallel with data transactions.\r\nSecond, we propose an Isolation and Check algorithm to enhance\r\nthe localization ability of the method. Moreover, the Monte-Carlo\r\nsimulations show that the proposed Statistical Detector increases\r\n×2 the number of detected faults when compared to conventional\r\nECC-based techniques. With the help of Isolation and Check,\r\nTSV-OCT localizes the number of defects up to ×4 and ×5\r\nhigher. In addition, the response time is kept below 65,000 cycles\r\nwhich could be easily integrated into real-time applications. On\r\nthe other hand, an implementation of TSV-OCT on a 3D Network-\r\non-Chip router shows no performance degradation for testing\r\nwhile having a reasonable area overhead."^^ . "2019" . . . "IEEE"^^ . . . "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"^^ . . . "10638210" . . . . . . . . . . . . . . . . "Abderazek Ben"^^ . "Abdallah"^^ . "Abderazek Ben Abdallah"^^ . . "Xuan Tu"^^ . "Tran"^^ . "Xuan Tu Tran"^^ . . "Akram Ben"^^ . "Ahmed"^^ . "Akram Ben Ahmed"^^ . . "Nam Khanh"^^ . "Dang"^^ . "Nam Khanh Dang"^^ . . . . . . "TSV-OCT: A Scalable Online Multiple-TSV Defects Localization for Real-Time 3-D-IC Systems (PDF)"^^ . . . "10.1109@TVLSI.2019.2948878.pdf"^^ . . . "TSV-OCT: A Scalable Online Multiple-TSV Defects Localization for Real-Time 3-D-IC Systems (Other)"^^ . . . . . . "indexcodes.txt"^^ . . . "TSV-OCT: A Scalable Online Multiple-TSV Defects Localization for Real-Time 3-D-IC Systems (Other)"^^ . . . . . . "lightbox.jpg"^^ . . . "TSV-OCT: A Scalable Online Multiple-TSV Defects Localization for Real-Time 3-D-IC Systems (Other)"^^ . . . . . . "preview.jpg"^^ . . . "TSV-OCT: A Scalable Online Multiple-TSV Defects Localization for Real-Time 3-D-IC Systems (Other)"^^ . . . . . . "medium.jpg"^^ . . . "TSV-OCT: A Scalable Online Multiple-TSV Defects Localization for Real-Time 3-D-IC Systems (Other)"^^ . . . . . . "small.jpg"^^ . . "HTML Summary of #3641 \n\nTSV-OCT: A Scalable Online Multiple-TSV Defects Localization for Real-Time 3-D-IC Systems\n\n" . "text/html" . . . "Electronics and Communications"@en . . . "Electronics and Computer Engineering"@en . . . "Scopus-indexed journals"@en . . . "ISI-indexed journals"@en . .