?url_ver=Z39.88-2004&rft_id=10.1109%2FACCESS.2020.2982836&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.au=Dang%2C+Nam+Khanh&rft.aulast=Dang&rft.aufirst=Nam+Khanh&rft.volume=8&rft.date=2020&rft.issn=2169-3536&rft.atitle=A+non-blocking+non-degrading+multiple+defects+link+testing+method+for+3D-Networks-on-Chip&rft.title=IEEE+Access&rft.pages=59571-59589&rft.genre=article