eprintid: 3942
rev_number: 12
eprint_status: archive
userid: 375
dir: disk0/00/00/39/42
datestamp: 2020-03-28 11:49:03
lastmod: 2020-04-24 04:14:09
status_changed: 2020-03-28 11:49:03
type: article
metadata_visibility: show
creators_name: Dang, Nam Khanh
creators_name: Meyer, Michael
creators_name: Ahmed, Akram Ben
creators_name: Abdallah, Abderazek Ben
creators_name: Tran, Xuan Tu
creators_id: dnk0904@gmail.com
creators_id: benab@u-aizu.ac.jp
creators_id: tutx@vnu.edu.vn
title: A non-blocking non-degrading multiple defects link testing method for 3D-Networks-on-Chip
ispublished: pub
subjects: ElectronicsandComputerEngineering
subjects: IT
subjects: Scopus
subjects: isi
divisions: lab_sis
abstract: As one of the most promising technologies to realize 3D Integrated Circuits (3D-ICs), Through-Silicon-Via (TSV) acts as the inter-layer link inside 3D Networks-on-Chip. 	However, the reliability issues due to the low yield rates and the sensitivity to thermal hotspots and stress issues are preventing TSV-based 3D-ICs from being widely and efficiently used. To ensure the correctness of TSV connections at run-time, detecting  multiple (clustering) defects is an important feature. While Error Correction Codes are limited by a certain number of detectable faults, using Built-In-Self-Test (BIST) prevents the system from operating normally during the test time. This paper first presents a Parity Product Code (PPC) with the ability to correct one fault and detect, at least, two faults. Second, we present extended PPC (EPPC) to detect multiple defects within the links of Networks-on-Chip by using two or more additional matrices. 	Furthermore, we present the distance-aware version of EPPC to detect multiple defects by using only one extra matrix. 
	The results show that the distance-aware EPPC can detect 100% of clustering defects and multiple random defects within two and three cycles, respectively. 
	The performance evaluation for Network-on-Chip testing also shows no degradation while providing an extremely short response time (2-3 cycles).
date: 2020
date_type: published
id_number: 10.1109/ACCESS.2020.2982836
full_text_status: public
publication: IEEE Access
volume: 8
pagerange: 59571-59589
refereed: TRUE
issn: 2169-3536
funders: QG.18.38
citation:   Dang, Nam Khanh and Meyer, Michael and Ahmed, Akram Ben and Abdallah, Abderazek Ben and Tran, Xuan Tu  (2020) A non-blocking non-degrading multiple defects link testing method for 3D-Networks-on-Chip.  IEEE Access, 8 .   pp. 59571-59589.  ISSN 2169-3536     
document_url: https://eprints.uet.vnu.edu.vn/eprints/id/eprint/3942/1/J7_EPPC_20200306.pdf