?url_ver=Z39.88-2004&rft_id=http%3A%2F%2Fdx.doi.org%2F10.21553%2Frev-jec.254&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.au=Vu+Huu%2C+Tien&rft.aulast=Vu+Huu&rft.aufirst=Tien&rft.issue=1-2&rft.volume=10&rft.date=June+2020&rft.issn=1859+-+378X&rft.atitle=Improving+TDWZ+Correlation+Noise+Estimation%3A+A+Deep+Learning+based+Approach&rft.title=REV+Journal+on+Electronics+and+Communications&rft.pages=1-10&rft.genre=article