@article{SisLab4430,
           month = {March},
           title = {HotCluster: A thermal-aware defect recovery
method for Through-Silicon-Vias Towards Reliable
3-D ICs systems},
          author = {Nam Khanh Dang and Akram Ben Ahmed and Abderazek Ben Abdallah and Xuan Tu Tran},
       publisher = {IEEE},
            year = {2021},
         journal = {IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems},
             url = {https://eprints.uet.vnu.edu.vn/eprints/id/eprint/4430/},
        abstract = {Through Silicon Via (TSV) is considered as the
near-future solution to realize low-power and high-performance
3D-Integrated Circuits (3D-ICs) and 3D-Network-on-Chips (3DNoCs). However, the lifetime reliability issue of TSV due to
its fault sensitivity and the high operating temperature of
3D-ICs, which also accelerates the fault-rate, is one of the
most critical challenges. Meanwhile, most current works focus
on detecting and correcting TSV defects after manufacturing
without considering high-temperature nodes? impact on lifetime
reliability. Besides, the recovery for defective clusters is also
challenging because of costly redundancies. In this work, we
present HotCluster: a hotspot-aware self-correction platform for
clustering defects in 3D-NoCs to help understand and tackle
this problem. We first give a method to predict normalized fault
rates and place redundant TSV groups according to each region?s
fault rate. In our particular medium fault-rate (normalized to the
coolest area), HotCluster reduces about 60\% of the redundancies
in comparison to the uniformly distributed redundancies while
having a higher ratio of router working in a normal state. Furthermore, HotCluster integrates both online (weight-based) and
offline (max-flow min-cut offline method) mapping algorithms to
help the system correct the faulty TSV clusters. The experimental
results show that both the max-flow min-cut offline method and
weight-based online mode with a redundancy of 0.25 exhibits less
than 1\% of routers disabled under 50\% defect-rates.}
}