relation: https://eprints.uet.vnu.edu.vn/eprints/id/eprint/4523/
title: Variability Fault Localization: A Benchmark
creator: Ngo, Kien Tuan
creator: Nguyen, Thu Trang
creator: Nguyen, Van Son
creator: Vo, Dinh Hieu
subject: Information Technology (IT)
description: Software fault localization is one of the most expensive, tedious, and time-consuming activities in program debugging. This activity becomes even much more challenging in Software Product Line (SPL) systems due to the variability of failures in SPL systems. These unexpected behaviors are caused by variability faults which can only be exposed under some combinations of system features. Although localizing bugs in non-configurable code has been investigated in-depth, variability fault localization in SPL systems still remains mostly unexplored. To approach this challenge, we propose a benchmark for variability fault localization with a large set of 1,773 buggy versions of six SPL systems and baseline variability fault localization performance results. Our hope is to engage the community to propose new and better approaches to the problem of variability fault localization in SPL systems.
type: Conference or Workshop Item
type: PeerReviewed
identifier:   Ngo, Kien Tuan and Nguyen, Thu Trang and Nguyen, Van Son and Vo, Dinh Hieu   Variability Fault Localization: A Benchmark.  In: 25th ACM International Systems and Software Product Line Conference (SPLC 2021), 6-11 Sept. 2021, Leicester, UK.