relation: https://eprints.uet.vnu.edu.vn/eprints/id/eprint/4703/ title: An Effective Framework of Private Ethereum Blockchain Networks for Smart Grid creator: Son, Do Hai creator: Thi Thuy Quynh, Tran creator: Khoa, Tran Viet creator: Thai Hoang, Dinh creator: Trung, Nguyen Linh creator: Viet Ha, Nguyen creator: Niyato, Dusit creator: Nguyen, Diep N. creator: Dutkiewicz, Eryk subject: Electronics and Computer Engineering description: A smart grid is an important application in Industry 4.0 with a lot of new technologies and equipment working together. Hence, sensitive data stored in the smart grid is vulnerable to malicious modification and theft. This paper proposes a framework to build a smart grid based on a highly effective private Ethereum network. Our framework provides a real smart grid that includes modern hardware and a smart contract to secure data in the blockchain network. To obtain high throughput but a low uncle rate, the difficulty calculation method used in the mining process of the Ethereum consensus mechanism is modified to adapt to the practical smart grid setup. The performance in terms of throughput and latency are evaluated by simulation and verified by the real smart grid setup. The enhanced private Ethereum-based smart grid has significantly better performance than the public one. Moreover, this framework can be applied to any system used to store data in the Ethereum network. date: 2021-09-14 type: Conference or Workshop Item type: PeerReviewed format: application/pdf language: en identifier: https://eprints.uet.vnu.edu.vn/eprints/id/eprint/4703/1/1570739910%20stamped-e.pdf identifier: Son, Do Hai and Thi Thuy Quynh, Tran and Khoa, Tran Viet and Thai Hoang, Dinh and Trung, Nguyen Linh and Viet Ha, Nguyen and Niyato, Dusit and Nguyen, Diep N. and Dutkiewicz, Eryk (2021) An Effective Framework of Private Ethereum Blockchain Networks for Smart Grid. In: 2021 International Conference on Advanced Technologies for Communications (ATC), 14-16 Oct. 2021, Ho Chi Minh City, Viet Nam. relation: https://ieeexplore.ieee.org/document/9598199