eprintid: 57 rev_number: 10 eprint_status: archive userid: 4 dir: disk0/00/00/00/57 datestamp: 2012-11-05 04:00:37 lastmod: 2017-01-17 02:40:17 status_changed: 2012-11-05 04:00:37 type: conference_item metadata_visibility: show creators_name: Pham, Thi Hong creators_name: Pham, Phi Hung creators_name: Tran, Xuan Tu creators_name: Kim, Chulwoo creators_id: hungpp@vnu.edu.vn creators_id: tutx@vnu.edu.vn corp_creators: VNU-UET title: Analysis and Evaluation of Traffic-Performance in a Backtracked Routing Network-on-Chip ispublished: pub subjects: ECE subjects: Electronics subjects: ElectronicsandComputerEngineering divisions: fac_fet divisions: lab_sis abstract: VLSI designers recently have adopted micro network-on-chip (or NoC) as an emerged solution to design complex SoC system under stringent constraints pertaining cost, size, power consumption, and short time-to-market. Characterization of on-chip traffics and traffic-performance evaluation are necessary steps bringing comprehensive and effective NoC design. This paper presents an analysis and performance evaluation framework of backtracked routing Network-on-Chip that provides guaranteed and energy-efficient data transfer. Experimental results, under common and application-oriented synthetic traffics, figure out the performance in terms of latency and throughput and suggest a tradeoff to developers to map applications into a proposed NoC platform. date: 2008-06-04 date_type: published full_text_status: public pres_type: paper pagerange: 13-17 event_title: The 2nd International Conference on Communications and Electronics (ICCE 2008) event_location: Hoian, Vietnam event_dates: 4-6 June 2008 event_type: conference refereed: TRUE citation: Pham, Thi Hong and Pham, Phi Hung and Tran, Xuan Tu and Kim, Chulwoo (2008) Analysis and Evaluation of Traffic-Performance in a Backtracked Routing Network-on-Chip. In: The 2nd International Conference on Communications and Electronics (ICCE 2008), 4-6 June 2008, Hoian, Vietnam. document_url: https://eprints.uet.vnu.edu.vn/eprints/id/eprint/57/1/Pham_NoC_HUT-ICCE08-IEEE.pdf