Request a copy

Dang, Nam Khanh and Meyer, Michael and Ahmed, Akram Ben and Abdallah, Abderazek Ben and Tran, Xuan Tu (2019) 2D-PPC: A single-correction multiple-detection method for Through-Silicon-Via Faults. In: IEEE Asia Pacific Conference on Circuits and Systems (APCCAS), 11-14 November 2019, Bangkok.
[img] PDF
Restricted to Repository staff only
709kB
Required Email address
+
-
Enter your email address.
Reason
+
-
You may enter a rationale for requesting this document.
VNU-UET Repository is powered by EPrints 3.4 which is developed by the School of Electronics and Computer Science at the University of Southampton. More information and software credits.