Nguyen, Ha Anh Tuan and Le, Sy Vinh and Le, Si Quang (2012) A Maximum Likelihood Method for Detecting Bad Samples from Illumina BeadChips Data. In: 2012 Fourth International Conference on Knowledge and Systems Engineering (KSE), 17-19 August 2012, Danang, Vietnam.
Full text not available from this repository.Abstract
Genotype data provide crucial information to understand effects of genetic variation to human health. Current microarray technologies are able to generate raw genotype data from thousands of samples across million of SNP sites. These raw data are processed by computational methods, called genotype caller, to obtain genotypes. Genotype calls of different callers might not be consistent due to noise of bad samples or SNPs. This requires a manual quality control step conducted by experts to remove bad samples or bad SNP sites. In this paper, we propose a maximum likelihood method to detect bad samples to improve the reliability of the results. Experiments with real data demonstrate the usefulness of our method in the quality control process. Thus, our method has the ability to reduce the number of samples that are requested to manually check by experts.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Uncontrolled Keywords: | Clustering algorithms;Educational institutions;Genetics;Maximum likelihood detection;Probability;Process control;Quality control;genetics;genomics;maximum likelihood detection;quality control;sampling methods;Illumina BeadChips data;bad SNP sites;bad samples detection;computational methods;genetic variation;genotype caller;genotype data;human health;manual quality control;maximum likelihood method;microarray technologies;quality control process;raw genotype data generation;SNP;bad samples;genotype;quality control; |
| Subjects: | Information Technology (IT) ?? IT_CS ?? |
| Divisions: | Faculty of Information Technology (FIT) |
| Depositing User: | Prof. Xuan-Tu Tran |
| Date Deposited: | 03 Jan 2013 04:15 |
| Last Modified: | 29 Jun 2013 04:43 |
| URI: | http://eprints.uet.vnu.edu.vn/eprints/id/eprint/106 |
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