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A Method for Automated Test Data Generation from Sequence Diagrams and Object Constraint Language

Vu, Thi Dao and Pham, Ngoc Hung and Nguyen, Viet Ha (2015) A Method for Automated Test Data Generation from Sequence Diagrams and Object Constraint Language. In: SoICT: the 2015 Symposium on Information and Communication Technology, 3-4 December 2015, Hue, Vietnam.

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Abstract

This paper proposes an automated test data generation method from the information embedded in model elements such as Unified Modeling Language (UML) sequence diagrams, class diagrams, and Object Constraint Language (OCL). The method supports UML 2.0 sequence diagrams including eight kinds of combined fragments describing control flow of systems. Comparing with some approaches by using depth first search (DFS) or breadth first search (BFS) algorithms, the proposed method generates all possible test scenarios with the higher error uncover capability. Test data for testing loop fragment is also generated. Therefore, it helps to detect errors in testing loops and the concurrency errors such as safety and liveness property of the systems.

Item Type: Conference or Workshop Item (Paper)
Subjects: Information Technology (IT)
Divisions: Faculty of Information Technology (FIT)
Depositing User: Viet Ha Nguyen
Date Deposited: 22 May 2016 08:15
Last Modified: 22 May 2016 08:19
URI: http://eprints.uet.vnu.edu.vn/eprints/id/eprint/1540

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