Le, Vu Ha and Gouiffes, Michele and Parrain, Fabien and Bosseboeuf, Alain and Zavidovique, Bertrand (2007) Image blur analysis for the subpixel-level measurement of in-plane vibration parameters of MEMS resonators. In: SPIE Optical Engineering + Applications, 2007, San Diego, CA, USA.
This is the latest version of this item.
Official URL: http://doi.org/10.1117/12.733533
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | Electronics and Communications > Communications Electronics and Communications Electronics and Communications > Electronics and Computer Engineering Information Technology (IT) |
| Divisions: | Faculty of Electronics and Telecommunications (FET) |
| Depositing User: | Lê Vũ Hà |
| Date Deposited: | 23 Nov 2017 07:08 |
| Last Modified: | 23 Nov 2017 07:08 |
| URI: | http://eprints.uet.vnu.edu.vn/eprints/id/eprint/2364 |
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- Image blur analysis for the subpixel-level measurement of in-plane vibration parameters of MEMS resonators. (deposited 23 Nov 2017 07:08) [Currently Displayed]
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