Dang, Nam Khanh and Ahmed, Akram Ben and Tran, Xuan Tu and Okuyama, Yuichi and Abdallah, Abderazek Ben (2017) A Comprehensive Reliability Assessment of Fault-Resilient Network-on-Chip Using Analytical Model. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 25 (11). pp. 3099-3112. ISSN 1063-8210
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Official URL: http://ieeexplore.ieee.org/document/8012492/
| Item Type: | Article |
|---|---|
| Subjects: | Electronics and Communications Electronics and Communications > Electronics and Computer Engineering Scopus-indexed journals ISI-indexed journals |
| Divisions: | Faculty of Electronics and Telecommunications (FET) Key Laboratory for Smart Integrated Systems (SISLAB) |
| Depositing User: | Prof. Xuan-Tu Tran |
| Date Deposited: | 31 Jul 2017 03:09 |
| Last Modified: | 07 Dec 2017 06:49 |
| URI: | http://eprints.uet.vnu.edu.vn/eprints/id/eprint/2562 |
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