Dang, Nam Khanh and Ahmed, Akram Ben and Abdallah, Abderazek Ben and Tran, Xuan Tu (2020) Thermal distribution and reliability prediction for 3D Networks-on-Chip. VNU Journal of Computer Science and Communication Engineering . ISSN 0866-8612
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Item Type: | Article |
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Subjects: | Electronics and Communications Electronics and Communications > Electronics and Computer Engineering |
Divisions: | Key Laboratory for Smart Integrated Systems (SISLAB) |
Depositing User: | Khanh N. Dang |
Date Deposited: | 05 Jun 2020 02:03 |
Last Modified: | 05 Jun 2020 02:03 |
URI: | http://eprints.uet.vnu.edu.vn/eprints/id/eprint/3960 |
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- Thermal distribution and reliability prediction for 3D Networks-on-Chip. (deposited 05 Jun 2020 02:03) [Currently Displayed]
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