Ngo, Kien Tuan and Nguyen, Thu Trang and Nguyen, Van Son and Vo, Dinh Hieu Variability Fault Localization: A Benchmark. In: 25th ACM International Systems and Software Product Line Conference (SPLC 2021), 6-11 Sept. 2021, Leicester, UK.
Full text not available from this repository.Abstract
Software fault localization is one of the most expensive, tedious, and time-consuming activities in program debugging. This activity becomes even much more challenging in Software Product Line (SPL) systems due to the variability of failures in SPL systems. These unexpected behaviors are caused by variability faults which can only be exposed under some combinations of system features. Although localizing bugs in non-configurable code has been investigated in-depth, variability fault localization in SPL systems still remains mostly unexplored. To approach this challenge, we propose a benchmark for variability fault localization with a large set of 1,773 buggy versions of six SPL systems and baseline variability fault localization performance results. Our hope is to engage the community to propose new and better approaches to the problem of variability fault localization in SPL systems.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | Information Technology (IT) |
| Divisions: | Faculty of Information Technology (FIT) |
| Depositing User: | Dr Vo Dinh Hieu |
| Date Deposited: | 28 Jun 2021 02:28 |
| Last Modified: | 28 Jun 2021 02:28 |
| URI: | http://eprints.uet.vnu.edu.vn/eprints/id/eprint/4523 |
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