Items where Author is "Eisuke, Tokumitsu"
Group by: Item Type | No Grouping Jump to: Article Number of items: 2. ArticlePham, Van Thanh and Bui, Nguyen Quoc Trinh and Takaaki, Miyasako and Phan, Trong Tue and Eisuke, Tokumitsu and Tatsuya, Shimoda (2013) Interface Charge Trap Density of Solution Processed Ferroelectric Gate Thin Film Transistor Using ITO/PZT/Pt Structure. Ferroelectrics Letters, 40 (2013). pp. 17-29. Pham, Van Thanh and Bui, Nguyen Quoc Trinh and Takaaki, Miyasako and Phan, Trong Tue and Eisuke, Tokumitsu and Tatsuya, Shimoda (2012) Electric Properties and Interface Charge Trap Density of Ferroelectric Gate Thin Film Transistor Using (Bi,La)4Ti3O12/Pb(Zr,Ti)O3 Stacked Gate Insulator. Japanese Journal of Applied Physics, 2014, 51 . 09LA09. ISSN 0021-4922 |
