Items where Author is "Nguyen, Van Son"
Group by: Item Type | No Grouping Jump to: Article | Conference or Workshop Item Number of items: 3. ArticleNguyen, Thu Trang and Ngo, Kien Tuan and Nguyen, Van Son and Vo, Dinh Hieu A Variability Fault Localization Approach for Software Product Lines. IEEE Transactions on Software Engineering . Conference or Workshop ItemLe, Ba Cuong and Nguyen, Van Son and Nguyen, Duc Anh and Pham, Ngoc Hung and Vo, Dinh Hieu (2017) JCIA: A Tool for Change Impact Analysis of Java EE Applications. In: 4th International Conference on Information Systems Design and Intelligent Applications, 15-17 June 2017, Danang, Vietnam. (In Press) Ngo, Kien Tuan and Nguyen, Thu Trang and Nguyen, Van Son and Vo, Dinh Hieu Variability Fault Localization: A Benchmark. In: 25th ACM International Systems and Software Product Line Conference (SPLC 2021), 6-11 Sept. 2021, Leicester, UK. |
