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The Temperature-Sensitivity of a Critical Electric Field Induced Magnetic Easy-Axis Reorientation Ferromagnetic/Ferroelectric Layered Heterostructures

Nguyen, Thi Minh Hong and Pham, Duc Thang and Dang, Dinh Long and Pham, Thai Ha and Nguyen, Ngoc Trung and Pham, Hong Cong and Nguyen, Dinh Duc (2014) The Temperature-Sensitivity of a Critical Electric Field Induced Magnetic Easy-Axis Reorientation Ferromagnetic/Ferroelectric Layered Heterostructures. Communications in Physics, 24 (3S1). p. 71. ISSN 0868-3166

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Abstract

We have investigated the effects of temperature on the magnetic easy axis reorientation (EARs) in polycrystalline ferromagnetic (FM) nano-scale thin films, i.e. (001)-oriented cubic films such as Fe, Ni, CFO and (0001)-oriented hexagonal films such as Co, grown on ferroelectric (FE) substrates, for example PZT, BTO substrates. The model of FM/FE bilayered heterostructures has been applied to study the total free energy of the FM films. By minimizing this energy, we have shown that temperature has a significant effect on a critical electric field induced magnetic reorientation.

Item Type: Article
Subjects: Engineering Mechanics
Engineering Physics
Divisions: Faculty of Engineering Physics and Nanotechnology (FEPN)
Depositing User: Ms. Cam Le Tran Thi
Date Deposited: 08 Nov 2015 08:51
Last Modified: 09 Nov 2015 05:56
URI: http://eprints.uet.vnu.edu.vn/eprints/id/eprint/1268

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