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Automated testing reactive systems from Event-B model

Vu, Dieu Huong and Truong, Anh Hoang and Chiba, Yuki and Aoki, Toshiaki (2017) Automated testing reactive systems from Event-B model. In: 2017 4th National Foundation for Science and Technology Development Conference on Information and Computer Science, 24-25 November2017, Ha Noi, Viet Nam.

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Abstract

We present a model-based testing approach for reactive systems where both test inputs and expected results are generated from `restricted' Event-B specifications. We show that it is possible to automatically build the restricted Event-B specifications from the original ones base on a knowledge base of the system under tests. The restricted models are to reduce the state space of the original Event-B models while preserving the possible testing paths, so that our model-based generated test suite can archive equivalent path coverage as using the original models. We also present a tool and a testing skeleton that are easy to use so that system developers can effectively test an arbitrary number of scenarios with reactive systems.

Item Type: Conference or Workshop Item (Paper)
Subjects: Information Technology (IT)
Divisions: Faculty of Information Technology (FIT)
Depositing User: Dieu Huong Vu
Date Deposited: 29 Nov 2017 08:37
Last Modified: 29 Nov 2017 08:37
URI: http://eprints.uet.vnu.edu.vn/eprints/id/eprint/2711

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