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High thermoelectric power factor in SnSe2 thin film grown on Al2O3 substrate

Duong, Anh Tuan and Nguyen, Dinh Lam and Nguyen, Manh Nghia and Nguen, Thi Minh Hai and Nguyen, Anh Duc and Pham, Anh Tuan and Ullah, Parman and Zeeshan, Tahir and Kim, Yong Soo and Do, Quang Trung and Nguyen, Tu and Bui, Van Hao and Raja, Das and Pham, Thanh Huy and Cho, Sunglae (2019) High thermoelectric power factor in SnSe2 thin film grown on Al2O3 substrate. Materials Research Express . ISSN 2053-1591

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Thermoelectric figure of merit (ZT) is highly sensitive to the carrier concentration and maximizes within the narrow region of 1019–1020 cm−3. The SnSe2 single crystal is predicted to have a high ZT value with carrier concentration in the range of 1019–1020 cm−3. Here, we grew SnSe2 thin film on Al2O3 substrate by pulsed laser deposition (PLD) with post-annealing at 400 °C in Argon for 60 min. The annealed thin film shows a high thermoelectric power factor up to 8 μW cm−1 K−2 at 220 K with a carrier concentration of 5.2 × 1019 cm−3. A hexagonal crystal structure of the SnSe2 thin film was confirmed by X-ray diffraction and Raman spectra measurements. The thin film showed an n-type semiconductor behavior. Maximum electrical conductivity and Seebeck coefficient were obtained at 220 K with the values of 210 Scm−1 and −192 μVK−1, respectively.

Item Type: Article
Subjects: Engineering Physics
ISI-indexed journals
Divisions: Faculty of Engineering Physics and Nanotechnology (FEPN)
Depositing User: Nguyê�n
Date Deposited: 28 Nov 2019 09:01
Last Modified: 29 Nov 2019 05:48

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