Nguyen, Thi Minh Hong and Pham, Duc Thang and Dang, Dinh Long and Pham, Thai Ha and Nguyen, Ngoc Trung and Pham, Hong Cong and Nguyen, Dinh Duc (2014) The Temperature-Sensitivity of a Critical Electric Field Induced Magnetic Easy-Axis Reorientation Ferromagnetic/Ferroelectric Layered Heterostructures. Communications in Physics, 24 (3S1). p. 71. ISSN 0868-3166
Full text not available from this repository.Abstract
We have investigated the effects of temperature on the magnetic easy axis reorientation (EARs) in polycrystalline ferromagnetic (FM) nano-scale thin films, i.e. (001)-oriented cubic films such as Fe, Ni, CFO and (0001)-oriented hexagonal films such as Co, grown on ferroelectric (FE) substrates, for example PZT, BTO substrates. The model of FM/FE bilayered heterostructures has been applied to study the total free energy of the FM films. By minimizing this energy, we have shown that temperature has a significant effect on a critical electric field induced magnetic reorientation.
| Item Type: | Article |
|---|---|
| Subjects: | Engineering Mechanics Engineering Physics |
| Divisions: | Faculty of Engineering Physics and Nanotechnology (FEPN) |
| Depositing User: | Ms. Cam Le Tran Thi |
| Date Deposited: | 08 Nov 2015 08:51 |
| Last Modified: | 09 Nov 2015 05:56 |
| URI: | http://eprints.uet.vnu.edu.vn/eprints/id/eprint/1268 |
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